JBJS -- Index by Author (Volume 84, Issue 8)

Index by Author: Aug 2002; Volume 84, Issue 8 [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: An, Kai-Nan [Abstract] [Full Text] [PDF]; Assendelft, W J [Full Text] [PDF]; Atroshi, Isam [Abstract] [Full Text] [PDF]
B: Babis, George C. [Abstract] [Full Text] [PDF]; Babis, George C. [Full Text] [PDF]; Badras, L S [Full Text] [PDF]; Banta, John V. [Abstract] [Full Text] [PDF]; Baron, John A. [Full Text] [PDF]; Barrett, Jane [Full Text] [PDF]; Baumgaertner, Michael R. [Full Text] [PDF]; Berend, Michael E. [Full Text] [PDF]; Bernini, Philip M. [Full Text] [PDF]; Billote, Dinna B. [Abstract] [Full Text] [PDF]; Boorman, Richard S. [Abstract] [Full Text] [PDF]; Bouter, L M [Full Text] [PDF]; Bouter, L M [Full Text] [PDF]; Brand, R. A. [Full Text] [PDF]; Brown, Thomas D. [Full Text] [PDF]; Bush, George W. [Full Text] [PDF]
C: Callaghan, John J. [Abstract] [Full Text] [PDF]; Campbell, Deirdre [Abstract] [Full Text] [PDF]; Carmody, Emily E. [Abstract] [Full Text] [PDF]; Chao, Edmund Y.S. [Abstract] [Full Text] [PDF]; Chaw, E. K. [Full Text] [PDF]; Churchill, R. Sean [Abstract] [Full Text] [PDF]; Collier, Matthew B. [Full Text] [PDF]; Commean, Paul K. [Abstract] [Full Text] [PDF]; Cook, Scott M. [Full Text] [PDF]; Coughlin, Michael J. [Full Text] [PDF]; Coutts, R. D. [Full Text] [PDF]; Crossett, Lawrence S. [Abstract] [Full Text] [PDF]
D: de Vet, H C [Full Text] [PDF]; Delay, Brian S. [Full Text] [PDF]; Deville, W L [Full Text] [PDF]
E: Egan, Michael [Full Text] [PDF]; Egli, Rainer J. [Abstract] [Full Text] [PDF]; Engh, Gerard A. [Full Text] [PDF]
F: Fehringer, Edward V. [Abstract] [Full Text] [PDF]; Flik, Kyle R. [Abstract] [Full Text] [PDF]; Fossel, Anne H. [Full Text] [PDF]; Franz�n, Herbert [Abstract] [Full Text] [PDF]
G: Ganz, Reinhold [Abstract] [Full Text] [PDF]; Gardner, Michael J. [Abstract] [Full Text] [PDF]; Gerritsen, A A [Full Text] [PDF]; Glisson, Silas N. [Abstract] [Full Text] [PDF]; Goater, J. Jeffrey [Abstract] [Full Text] [PDF]; Goetz, Devon D. [Abstract] [Full Text] [PDF]; Green, David [Abstract] [Full Text] [PDF]
H: Hardinge, Kevin [Abstract] [Full Text] [PDF]; Harris, William H. [Full Text] [PDF]; Helfet, David L. [Abstract] [Full Text] [PDF]; Hempfing, Axel [Abstract] [Full Text] [PDF]; Henderson, Antony [Full Text] [PDF]; Hirachi, Kazuhiko [Abstract] [Full Text] [PDF]; Hirayama, Takuya [Abstract] [Full Text] [PDF]; Huo, Michael H. [Full Text] [PDF]
I: Iwasaki, Norimasa [Abstract] [Full Text] [PDF]
J: Johnson, Jeffrey E. [Abstract] [Full Text] [PDF]; Johnsson, Ragnar [Abstract] [Full Text] [PDF]; Johnston, Richard C. [Abstract] [Full Text] [PDF]; Jones, Peter W. [Abstract] [Full Text] [PDF]; Joshi, Atul B. [Abstract] [Full Text] [PDF]
K: Karam, M. D. [Full Text] [PDF]; Kataoka, Masashi [Full Text] [PDF]; Kato, Hiroyuki [Abstract] [Full Text] [PDF]; Katz, Jeffrey N. [Full Text] [PDF]; Kim, Harry K.W. [Abstract] [Full Text] [PDF]; Kim, J.-S. [Abstract] [Full Text] [PDF]; Kim, Young-Hoo [Abstract] [Full Text] [PDF]; Kloen, Peter [Abstract] [Full Text] [PDF]; Kopjar, Branko [Abstract] [Full Text] [PDF]; Korthals-de Bos, I B [Full Text] [PDF]
L: Lane, Joseph M. [Abstract] [Full Text] [PDF]; Lasser, Stephen [Full Text] [PDF]; Leunig, Michael [Abstract] [Full Text] [PDF]; Lew, Robert A. [Full Text] [PDF]; Liew, Alan [Abstract] [Full Text] [PDF]; Losina, Elena [Full Text] [PDF]
M: MacEwen, G. Dean [Full Text] [PDF]; Maher, Nancy [Full Text] [PDF]; Mahomed, Nizar N. [Full Text] [PDF]; Markovic, Ljubisa [Abstract] [Full Text] [PDF]; Matsen, Frederick A., III [Abstract] [Full Text] [PDF]; Matsen, Frederick A., III [Full Text] [PDF]; McGrath, Brian E. [Full Text] [PDF]; Minami, Akio [Abstract] [Full Text] [PDF]; Mindell, Eugene R. [Full Text] [PDF]; Mooar, Pekka [Abstract] [Full Text] [PDF]; Morrey, Bernard F. [Full Text] [PDF]; Mueller, Michael J. [Abstract] [Full Text] [PDF]; Murphy, John C.M. [Abstract] [Full Text] [PDF]; Myers, Elizabeth [Abstract] [Full Text] [PDF]
N: Noel, Curtis R. [Full Text] [PDF]
O: O'Driscoll, Shawn W. [Full Text] [PDF]; O'Keefe, Regis J. [Abstract] [Full Text] [PDF]; O'Rourke, Michael R. [Abstract] [Full Text] [PDF]; Oh, S.-W. [Abstract] [Full Text] [PDF]; Ornstein, Ewald [Abstract] [Full Text] [PDF]
P: Patel, Nilesh M. [Full Text] [PDF]; Phillips, Charlotte B. [Full Text] [PDF]; Pilgram, Thomas [Abstract] [Full Text] [PDF]; Poehling, Gary G. [Full Text] [PDF]; Poss, Robert [Full Text] [PDF]
R: Ramsey, Paul L. [Full Text] [PDF]; Rand, James A. [Abstract] [Full Text] [PDF]; Rao, Anand R. [Full Text] [PDF]; Rimmer, Jane [Full Text] [PDF]; Ritter, Merrill A. [Full Text] [PDF]; Robertson, Douglas D. [Abstract] [Full Text] [PDF]; Rubash, Harry E. [Abstract] [Full Text] [PDF]; Rubel, Iv�n F. [Abstract] [Full Text] [PDF]
S: Sandell, Linda J. [Full Text] [PDF]; Sandquist, Per [Abstract] [Full Text] [PDF]; Scholten, R J [Full Text] [PDF]; Schultz, W. Randall [Abstract] [Full Text] [PDF]; Schwartz, Mark [Abstract] [Full Text] [PDF]; Schwarz, Edward M. [Abstract] [Full Text] [PDF]; Sechriest, V. Franklin [Abstract] [Full Text] [PDF]; Shaylor, Phillip J. [Full Text] [PDF]; Sherry, Eugene [Full Text] [PDF]; Silva, Matthew J. [Full Text] [PDF]; Sim, Franklin H. [Abstract] [Full Text] [PDF]; Sinha, Raj K. [Abstract] [Full Text] [PDF]; Slakey, Joseph B. [Abstract] [Full Text] [PDF]; Smidt, N [Full Text] [PDF]; Smith, Brian G. [Abstract] [Full Text] [PDF]; Smith, Kevin L. [Abstract] [Full Text] [PDF]; Smith, Kirk E. [Abstract] [Full Text] [PDF]; Sporer, Scott M. [Full Text] [PDF]; Styf, Jorma [Full Text] [PDF]; Su, Phi-Huynh [Abstract] [Full Text] [PDF]; Sullivan, Patrick M. [Abstract] [Full Text] [PDF]; Sundberg, Martin [Abstract] [Full Text] [PDF]; Szabo, Robert M. [Full Text] [PDF]; S�balle, Kjeld [Abstract] [Full Text] [PDF]
T: Taira, Hirofumi [Full Text] [PDF]; Takita, Chikahiro [Full Text] [PDF]; Thomson, Jeffrey D. [Abstract] [Full Text] [PDF]; Trivedi, Jayesh [Abstract] [Full Text] [PDF]; Trousdale, Robert T. [Full Text] [PDF]; Tsumura, Hiroshi [Full Text] [PDF]; Tullar, Jessica [Full Text] [PDF]
U: Uitdehaag, B M [Full Text] [PDF]; Ulrich-Vinther, Michael [Abstract] [Full Text] [PDF]
V: van der Windt, D A [Full Text] [PDF]; van Geldere, D [Full Text] [PDF]; Vossinakis, I C [Full Text] [PDF]
W: Warnke, Patrick H. [Full Text] [PDF]; Weiner, Bradley K. [Full Text] [PDF]; Weinstein, James N. [Abstract] [Full Text] [PDF]; Weinstein, Stuart L. [Abstract] [Full Text] [PDF]; Weinstein, Stuart L. [Full Text] [PDF]; Whitesides, Thomas E., Jr. [Full Text] [PDF]; Wingenfeld, Carsten [Abstract] [Full Text] [PDF]; Wixson, Richard L. [Abstract] [Full Text] [PDF]
Y: Yoshida, Seiji [Full Text] [PDF]