JBJS -- Index by Author (Volume 84, Issue 5)

Index by Author: May 2002; Volume 84, Issue 5 [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aaron, Roy K. [Full Text] [PDF]; Abel, Mark F. [Abstract] [Full Text] [PDF]; Ahlmann, Elke [Abstract] [Full Text] [PDF]; Ahn, Jaimo [Full Text] [PDF]; Alikhan, R. [Full Text] [PDF]; Amendola, Annunziato [Abstract] [Full Text] [PDF]; Amstutz, Harlan C. [Full Text] [PDF]; An, K. N. [Abstract] [Full Text] [PDF]; annotti, Joseph P.I [Full Text] [PDF]
B: Baddar, Adrian [Abstract] [Full Text] [PDF]; Bailey, Christopher S. [Abstract] [Full Text] [PDF]; Barbera, Carl [Full Text] [PDF]; Bates, D W [Full Text] [PDF]; Batouk, Omar [Full Text] [PDF]; Berry, Daniel J. [Full Text] [PDF]; Berry, Daniel J. [Full Text] [PDF]; Betz, Randal [Full Text] [PDF]; Bezwada, Hari P. [Full Text] [PDF]; Bhowal, B [Full Text] [PDF]; Blanco, John S. [Abstract] [Full Text] [PDF]; Blanke, Kathy [Full Text] [PDF]; Bridwell, Keith [Full Text] [PDF]; Brunet, Jacques A. [Full Text] [PDF]; Bryk, Eli [Full Text] [PDF]
C: Callaghan, John J. [Full Text] [PDF]; Carmines, David V. [Abstract] [Full Text] [PDF]; Chen, Chuan-Mu [Abstract] [Full Text] [PDF]; Chiu, Fang-Yao [Abstract] [Full Text] [PDF]; Clare, David J. [Full Text] [PDF]; Clark, Charles R. [Full Text] [PDF]; Clements, David [Full Text] [PDF]; Cole, Peter A. [Full Text] [PDF]; Comp, Philip C. [Full Text] [PDF]; Crowther, James D. [Abstract] [Full Text] [PDF]
D: Damiano, Diane L. [Abstract] [Full Text] [PDF]; Degutis, Linda C. [Full Text] [PDF]; Dervin, Geoff F. [Full Text] [PDF]; Dervin, Geoffrey F. [Full Text] [PDF]; Deshmukh, R. G. [Full Text] [PDF]; Dias, J J [Full Text] [PDF]; Dome, David C. [Abstract] [Full Text] [PDF]; Dorey, Frederick J. [Full Text] [PDF]; Driscoll, Jon C. [Full Text] [PDF]
E: Easterbrook, James [Full Text] [PDF]; Edwards, Bryan T. [Full Text] [PDF]; Egol, Kenneth [Full Text] [PDF]
F: Falkenberg, B [Full Text] [PDF]; Fitzgerald, Robert H., Jr. [Full Text] [PDF]; Fitzsimmons, James S. [Abstract] [Full Text] [PDF]; Frick, Steven L. [Full Text] [PDF]; Friedman, Richard J. [Full Text] [PDF]; Fu, Freddie H. [Full Text] [PDF]
G: Gardiner, Geoffrey A., Jr. [Full Text] [PDF]; Garino, Jonathan P. [Abstract] [Full Text] [PDF]; Gilbart, Michael [Full Text] [PDF]; Granata, Kevin [Abstract] [Full Text] [PDF]; Groh, Gordon I. [Full Text] [PDF]
H: Haidukewych, George J. [Full Text] [PDF]; Halder, A. M. [Abstract] [Full Text] [PDF]; Healey, David C. [Full Text] [PDF]; Heers, G. [Abstract] [Full Text] [PDF]; Holtom, Paul [Abstract] [Full Text] [PDF]; Huard, Johnny [Full Text] [PDF]
I: Israel, T. Andrew [Full Text] [PDF]; Itoi, Eiji [Full Text] [PDF]
J: Jackson, Douglas W. [Full Text] [PDF]; Jain, Rina [Full Text] [PDF]; Jain, Ritu [Abstract] [Full Text] [PDF]; Jensen, K H [Full Text] [PDF]; Johnson, Gerhard J. [Full Text] [PDF]; Jones, Alan L. [Full Text] [PDF]
K: Kamineni, Srinath [Abstract] [Full Text] [PDF]; Katz, J N [Full Text] [PDF]; Kim, J.-S. [Abstract] [Full Text] [PDF]; Kim, Young-Hoo [Abstract] [Full Text] [PDF]; Kook, H.-K. [Abstract] [Full Text] [PDF]; Koval, Kenneth [Full Text] [PDF]; Kreusch-Brinker, R. [Abstract] [Full Text] [PDF]; Krismer, Martin [Full Text] [PDF]
L: Lachiewicz, Paul F. [Abstract] [Full Text] [PDF]; Lai, Max [Abstract] [Full Text] [PDF]; Larson, Robert L. [Full Text] [PDF]; Lassiter, Tally E., Jr. [Full Text] [PDF]; Leffert, Robert D. [Full Text] [PDF]; Lenke, Lawrence G. [Full Text] [PDF]; Li, Yong [Full Text] [PDF]; Lieberman, Jay R. [Full Text] [PDF]; Lin, Chien-Fu Jeff [Abstract] [Full Text] [PDF]; Lipton, Jeffrey F. [Full Text] [PDF]; Lo, Wai-Hee [Abstract] [Full Text] [PDF]; Lotke, Paul A. [Full Text] [PDF]; Lowe, Thomas [Full Text] [PDF]
M: Maloney, William J. [Full Text] [PDF]; Maritz, N. G. [Abstract] [Full Text] [PDF]; Mears, Dana C. [Abstract] [Full Text] [PDF]; Mehlman, Charles T. [Full Text] [PDF]; Merrell, Gregory A. [Full Text] [PDF]; Minagawa, Hiroshi [Full Text] [PDF]; Mirzayan, Raffy [Full Text] [PDF]; Miura, Yasushi [Abstract] [Full Text] [PDF]; Moed, Berton R. [Abstract] [Full Text] [PDF]; Montv, Michael A. [Full Text] [PDF]; Moritz, Markus [Full Text] [PDF]; Morrey, Bernard F. [Abstract] [Full Text] [PDF]; Mura, N. [Abstract] [Full Text] [PDF]
N: Nimityongskul, Prasit [Full Text] [PDF]; Nogler, Michael [Full Text] [PDF]
O: O'Connell, M. B. [Full Text] [PDF]; O'Driscoll, S. W. [Abstract] [Full Text] [PDF]; O'Driscoll, Shawn W. [Abstract] [Full Text] [PDF]; Ong, Alvin [Abstract] [Full Text] [PDF]
P: Pagnani, Michael J. [Abstract] [Full Text] [PDF]; Parvizi, Javad [Abstract] [Full Text] [PDF]; Patterson, J. Douglas [Full Text] [PDF]; Patzakis, Michael [Abstract] [Full Text] [PDF]; Princep, A. [Full Text] [PDF]
R: Rachbauer, Franz [Full Text] [PDF]; Rayadhyaksha, Amar [Full Text] [PDF]; Renshaw, Thomas S. [Full Text] [PDF]; Rockwood, Charles A., Jr. [Full Text] [PDF]; Roidis, Nikolaos [Abstract] [Full Text] [PDF]; Roswell, M [Full Text] [PDF]; R�hmann, Oliver [Full Text] [PDF]
S: Saleh, Khaled J. [Full Text] [PDF]; Sanders, David W. [Full Text] [PDF]; Sarwark, John F. [Full Text] [PDF]; Sashi, Ryuji [Full Text] [PDF]; Sato, Kozo [Full Text] [PDF]; Schaffer, J L [Full Text] [PDF]; Schultz, K [Full Text] [PDF]; Shaw, James A. [Full Text] [PDF]; Shepherd, Lane [Abstract] [Full Text] [PDF]; Shimizu, Togo [Full Text] [PDF]; Shin, Alexander Y. [Full Text] [PDF]; Simel, D L [Full Text] [PDF]; Sitler, David F. [Abstract] [Full Text] [PDF]; Skinner, Harry B. [Full Text] [PDF]; Slocum, Donald B. [Full Text] [PDF]; Solomon, D H [Full Text] [PDF]; Spencer, Edwin E., Jr. [Full Text] [PDF]; Spiro, T. E. [Full Text] [PDF]; Spiro, Theodore E. [Full Text] [PDF]; Spouge, Alison [Abstract] [Full Text] [PDF]; Steinberg, Ely L. [Full Text] [PDF]; Steinberg, Marvin E. [Abstract] [Full Text] [PDF]; Stephen, David [Full Text] [PDF]; Stocks, Gregory W. [Full Text] [PDF]; Stryger, V [Full Text] [PDF]; Swiontkowski, Marc F. [Full Text] [PDF]; Symons, S [Full Text] [PDF]
T: Tamai, Junichi [Full Text] [PDF]; Tejwani, Nirmal [Full Text] [PDF]; Thain, Lisa M.F. [Abstract] [Full Text] [PDF]; Thomas, Frank [Full Text] [PDF]
U: Urbaniak, James R. [Full Text] [PDF]; Urbaniak, James R. [Full Text] [PDF]
V: van Cappelle, Henk G.J. [Full Text] [PDF]; Velyvis, John H. [Abstract] [Full Text] [PDF]; Vigorita, Vincent J. [Full Text] [PDF]
W: Wakabayashi, Ikuko [Full Text] [PDF]; Watson, J. Tracy [Abstract] [Full Text] [PDF]; Webber, John B. [Full Text] [PDF]; Weber, Stephen C. [Abstract] [Full Text] [PDF]; Werther, K [Full Text] [PDF]; Whitsett, T. L. [Full Text] [PDF]; Whitsett, Thomas L. [Full Text] [PDF]; WillsonCarr, Seann E. [Abstract] [Full Text] [PDF]; Wirth, Michael A. [Full Text] [PDF]; Wolinsky, Philip [Full Text] [PDF]; Wong, Kirk L. [Abstract] [Full Text] [PDF]
Y: Young, T. R. [Full Text] [PDF]
Z: Zaw, H. M. [Full Text] [PDF]; Zionts, Lewis E. [Full Text] [PDF]; Zobitz, M. E. [Abstract] [Full Text] [PDF]