JBJS -- Index by Author (Volume 82, Issue 8)

Index by Author: Aug 2000; Volume 82, Issue 8 [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abudu, A. [Full Text] [PDF]; Aldegheri, Roberto [Full Text] [PDF]; Alvine, Frank G. [Full Text] [PDF]; Armstrong, David G. [Full Text] [PDF]; Aronsson, David D. [Full Text] [PDF]
B: Bagnall, Keith M. [Full Text] [PDF]; Bankes, Marcus J. K. [Full Text] [PDF]; Bilker, Warren B. [Abstract] [Full Text] [PDF]; Briggs, Karen K. [Full Text] [PDF]
C: Callaghan, John J. [Full Text] [PDF]; Carlson, Jeffrey R. [Abstract] [Full Text] [PDF]; Carter, S. R. [Full Text] [PDF]; Caterini, Roberto [Full Text] [PDF]; Cole, Brian J. [Abstract] [Full Text] [PDF]; Cruess, Richard L. [Full Text] [PDF]; Cruess, Sylvia R. [Full Text] [PDF]
D: Davis, Barclay [Abstract] [Full Text] [PDF]; Dearborn, John T. [Abstract] [Full Text] [PDF]; Deol, Gurvinder [Abstract] [Full Text] [PDF]; Devarajan, G. [Full Text] [PDF]; Dobbs, Matthew B. [Full Text] [PDF]; Dowd, James E. [Abstract] [Full Text] [PDF]
E: Edgar, Michael [Full Text] [PDF]; Engh, Charles A. [Abstract] [Full Text] [PDF]; Eskandar, Enass [Full Text] [PDF]
F: Farsetti, Pasquale [Full Text] [PDF]; Felker, Kevin [Abstract] [Full Text] [PDF]; Fiorenza, F. [Full Text] [PDF]; Formisano, Rita [Full Text] [PDF]; Freedman, Kevin B. [Abstract] [Full Text] [PDF]; Freiberg, Andrew A. [Full Text] [PDF]; Fu, Freddie H. [Full Text] [PDF]
G: Garlan, Douglas E. [Full Text] [PDF]; Garrick, James G. [Full Text] [PDF]; Gebhardt, Mark C. [Abstract] [Full Text] [PDF]; Gebhardt, Mark C. [Abstract] [Full Text] [PDF]; Genelin, Alexander [Full Text] [PDF]; Gerngross, Heinz [Full Text] [PDF]; Gibbons, C. T. [Full Text] [PDF]; Gitelis, Steven [Abstract] [Full Text] [PDF]; Gregori, A. [Full Text] [PDF]; Grimer, R. J. [Full Text] [PDF]; Gupta, Ravi [Full Text] [PDF]
H: Harner, Christopher D. [Full Text] [PDF]; Harris, William H. [Abstract] [Full Text] [PDF]; Heckman, James D. [Full Text] [PDF]; Hedman, Thomas P. [Full Text] [PDF]; Holtom, Paul D. [Abstract] [Full Text] [PDF]; Horvath, Gy�z� [Full Text] [PDF]; Hutton, Kirk S. [Full Text] [PDF]
I: Illés, Tamás [Full Text] [PDF]; Ippolito, Ernesto [Full Text] [PDF]; Irrgang, James J. [Full Text] [PDF]; Irrgang, Jay [Abstract] [Full Text] [PDF]; Itamura, John M. [Abstract] [Full Text] [PDF]
J: Jacobs, Christopher R. [Abstract] [Full Text] [PDF]; Johnston, Sharon E. [Full Text] [PDF]
K: Kaplan, Frederick S. [Abstract] [Full Text] [PDF]; Kathrein, Anton [Full Text] [PDF]; Kiyoshige, Yashiro [Full Text] [PDF]; Koman, Jon D. [Full Text] [PDF]; Kuschner, Stuart H. [Full Text] [PDF]
L: L'Insalata, John [Abstract] [Full Text] [PDF]; Lawrence, T. N. [Full Text] [PDF]; Lee, Francis Y. I. [Abstract] [Full Text] [PDF]; Lesh, Mark L. [Abstract] [Full Text] [PDF]; Lewis, Valerae O. [Abstract] [Full Text] [PDF]; Loder, Randall T. [Full Text] [PDF]; Lowe, Robert A. [Abstract] [Full Text] [PDF]; Lowe, Thomas G. [Full Text] [PDF]
M: Mahood, James [Full Text] [PDF]; Malchow, Dee [Abstract] [Full Text] [PDF]; Mallin, Bruce A. [Abstract] [Full Text] [PDF]; Mangham, D. C. [Full Text] [PDF]; Mankin, Henry J. [Full Text] [PDF]; Mankin, Henry J. [Abstract] [Full Text] [PDF]; Margulies, Joseph Y. [Full Text] [PDF]; Marx, Robert G. [Full Text] [PDF]; Matsen, Frederick A., III [Abstract] [Full Text] [PDF]; Matsen, Susanna L. [Abstract] [Full Text] [PDF]; Meiss, Ludwig [Full Text] [PDF]; Miller, Nancy H. [Full Text] [PDF]; Mirzayan, Raffy [Abstract] [Full Text] [PDF]; Moreau, Marc [Full Text] [PDF]; Morrey, Bernard F. [Abstract] [Full Text] [PDF]
O: Oni, Olusola O. A. [Full Text] [PDF]
P: Partington, P. E. [Full Text] [PDF]; Parvizi, Javad [Abstract] [Full Text] [PDF]; Patzakis, Michael J. [Abstract] [Full Text] [PDF]; Pelligrini, Vincent D., Jr. [Abstract] [Full Text] [PDF]; Penta, Francesca [Full Text] [PDF]; Petersen, M. B. [Full Text] [PDF]; Plancher, Kevin D. [Full Text] [PDF]; Poser, Robert D. [Full Text] [PDF]; Poulsen, I. H. [Full Text] [PDF]; Pritchett, James W. [Full Text] [PDF]; Pyevich, Michael T. [Full Text] [PDF]
Q: Qureshi, Abid A. [Abstract] [Full Text] [PDF]
R: Ramappa, Arun J. [Abstract] [Full Text] [PDF]; Rangaswamy, Leela [Full Text] [PDF]; Rangger, Christoph [Full Text] [PDF]; Raso, V. James [Full Text] [PDF]; Raso, V. James [Full Text] [PDF]; Reinker, Kent A. [Full Text] [PDF]; Rettig, Michael E [Full Text] [PDF]; Rivard, Charles-Hilaire [Full Text] [PDF]; Rodeo, Scott A. [Abstract] [Full Text] [PDF]; Rodriguez-Merchan, E. Carlos [Full Text] [PDF]
S: Saltzman, Charles L. [Full Text] [PDF]; Sanders, James O. [Full Text] [PDF]; Sarmiento, Augusto [Full Text] [PDF]; Schneider, David J. [Abstract] [Full Text] [PDF]; Seneviratne, Aruna [Abstract] [Full Text] [PDF]; Sherman, Randy [Abstract] [Full Text] [PDF]; Shott, Susan [Abstract] [Full Text] [PDF]; Snyder-Mackler, Lynn [Full Text] [PDF]; Solgaard, S. [Full Text] [PDF]; Springfield, Dempsey S. [Abstract] [Full Text] [PDF]; Squire, D. S. [Full Text] [PDF]; Steadman, J. Richard [Full Text] [PDF]; Sterk, Jurgen [Full Text] [PDF]; Strom, Brian L. [Abstract] [Full Text] [PDF]; Suzuki, Katsunori [Abstract] [Full Text] [PDF]; Sychterz, Christi J. [Abstract] [Full Text] [PDF]
T: Tang, Peter [Abstract] [Full Text] [PDF]; Thomsen, J. [Full Text] [PDF]; Thordarson, David B. [Full Text] [PDF]; Tillman, R. M. [Full Text] [PDF]
V: Vangsness, Thomas, Jr. [Abstract] [Full Text] [PDF]
W: Wainner, Robert S. [Full Text] [PDF]; Wang, Xiaoping [Full Text] [PDF]; Warner, Jon J. P. [Abstract] [Full Text] [PDF]; Warren, Russell F. [Abstract] [Full Text] [PDF]; Weinstein, Stuart L. [Full Text] [PDF]; Wickiewicz, Thomas L. [Abstract] [Full Text] [PDF]; Willy, Christian [Full Text] [PDF]
Y: Yetkinler, Duran N. [Full Text] [PDF]; Young, Anthony M. [Abstract] [Full Text] [PDF]
Z: Zhao, Jie [Full Text] [PDF]